Job Details:

Job Description:

• Develop full chip test methods, on-chip DFT Design-for-Test definition and verification, test vector generation and coverage analysis, ATE program development, and 1st silicon debug for Intel's FPGA products.

• Collaborate with worldwide cross-functional teams including designers, software, manufacturing, and product engineering, as you drive for test capability throughout the entire product development cycle.

• Drive test optimizations to reduce test cost, enhance product quality, improve manufacturing efficiency and accelerate manufacturing stability.

• Develop CMT/HMDT test module, conversion test pattern from STIL to pobj, doing test program validation on tester.

Qualifications:

• BS/MS in Electrical Engineering or equivalent.

• Strong digital or analog circuit fundamentals, understanding of scan/ATPG test methodology is an added advantage.

• Silicon bring-up and ATE experience is preferred.

• Well versed in test industry trends and technology.

• Self-motivated, with proven collaboration and leadership skills.

Job Type:

Regular

Shift:

Shift 1 (Malaysia)

Primary Location:

Penang 15, Penang, Malaysia

Additional Locations:

Posting Statement:

All qualified applicants will receive consideration for employment without regard to race, color, religion, religious creed, sex, national origin, ancestry, age, physical or mental disability, medical condition, genetic information, military and veteran status, marital status, pregnancy, gender, gender expression, gender identity, sexual orientation, or any other characteristic protected by local law, regulation, or ordinance.